Empirical model-building and response surface
Empirical model-building and response surface
An integrated approach to realistic worst-case design optimization of MOS analog circuits
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
Improved methods for worst-case analysis and optimization incorporating operating tolerances
DAC '93 Proceedings of the 30th international Design Automation Conference
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Getting to the bottom of deep submicron
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
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A new algorithm to determine the number and value of realistic worst-case models for the performance of module library components is presented in this paper. The proposed algorithm employs Principal Components Analysis (PCA) at the performance level to identify the main independent sources of variance for the performance of a set of library modules.Response Surfaces Methodology (RSM) and Propagation Of Variance (POV) based algorithms are used to efficiently compute the performance level covariance matrix and non-linear maximum likelihood optimization to trace back worst case models at the SPICE level. The effectiveness of the proposed methodology has been demonstrated by determining a realistic set of worst case models for a 0.25mm CMOS standard cell library.