An assigned probability technique to derive realistic worst-case timing models of digital standard cells

Authors:
Alessandro Dal Fabbro;Bruno Franzini;Luigi Croce;Carlo Guardiani
Affiliations:
SGS-THOMSON Microelectronics, v. C.Olivetti, 2, 20041 Agrate Brianza (MI), ITALY;SGS-THOMSON Microelectronics, v. C.Olivetti, 2, 20041 Agrate Brianza (MI), ITALY;SGS-THOMSON Microelectronics, v. C.Olivetti, 2, 20041 Agrate Brianza (MI), ITALY;SGS-THOMSON Microelectronics, v. C.Olivetti, 2, 20041 Agrate Brianza (MI), ITALY
Venue:
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Year:
1995

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