An integrated approach to realistic worst-case design optimization of MOS analog circuits
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
Design verification considering manufacturing tolerances by using worst-caste distances
EURO-DAC '92 Proceedings of the conference on European design automation
VLSI Design for Manufacturing: Yield Enhancement
VLSI Design for Manufacturing: Yield Enhancement
Realistic Worst-Case Modeling by Performance Level Principal Component Analysis
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
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