Moore's law and physical design of ICs
ISPD '98 Proceedings of the 1998 international symposium on Physical design
Filling and slotting: analysis and algorithms
ISPD '98 Proceedings of the 1998 international symposium on Physical design
Getting to the bottom of deep submicron
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
Interconnect tuning strategies for high-performance ICs
Proceedings of the conference on Design, automation and test in Europe
Application of automated design migration to alternating phase shift mask design
Proceedings of the 2001 international symposium on Physical design
New graph bipartizations for double-exposure, bright field alternating phase-shift mask layout
Proceedings of the 2001 Asia and South Pacific Design Automation Conference
Design technology productivity in the DSM era (invited talk)
Proceedings of the 2001 Asia and South Pacific Design Automation Conference
Proceedings of the 38th annual Design Automation Conference
Research directions for coevolution of rules and routers
Proceedings of the 2003 international symposium on Physical design
An Efficient Rule-Based OPC Approach Using a DRC Tool for 0.18µm ASIC
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
Pattern Selection for Testing of Deep Sub-Micron Timing Defects
Proceedings of the conference on Design, automation and test in Europe - Volume 2
Phase correct routing for alternating phase shift masks
Proceedings of the 41st annual Design Automation Conference
Toward a systematic-variation aware timing methodology
Proceedings of the 41st annual Design Automation Conference
Physical CAD changes to incorporate design for lithography and manufacturability
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
Self-Compensating Design for Focus Variation
Proceedings of the 42nd annual Design Automation Conference
Yield-preferred via insertion based on novel geotopological technology
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Statistical timing analysis based on simulation of lithographic process
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
Statistical design of the 6T SRAM bit cell
IEEE Transactions on Circuits and Systems Part I: Regular Papers
| Hi-index | 0.00 |