Getting to the bottom of deep submicron
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
An IEEE 1149.1-Based Test Access Architecture for ICs with Embedded Cores
Proceedings of the IEEE International Test Conference
Testing embedded-core based system chips
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A structured and scalable mechanism for test access to embedded reusable cores
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Adapting Scan Architectures for Low Power Operation
ITC '00 Proceedings of the 2000 IEEE International Test Conference
| Hi-index | 0.01 |
Trends in System Level Integration (SLI) are analyzed.Based on projections from the SIA roadmap and othersources, the impact of achievable reuse on design andmanufacturing cost is projected. Similar analysis suggeststhat while test execution cost is currently equivalent todesign expense in its effect on total production cost, it willdominate in the future. Core testability and its relationshipwith core 'firmness' is also examined. The implications ofthese trends on core providers and integrators, standards,tester manufacturers and CAD vendors are investigated.