ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
BiTeS: a BDD based test pattern generator for strong robust path delay faults
EURO-DAC '94 Proceedings of the conference on European design automation
Efficient partitioning and analysis of digital CMOS-circuits
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Deterministic test generation for non-classical faults on the gate level
ATS '95 Proceedings of the 4th Asian Test Symposium
On-line error detection and fast recover techniques for dependable embedded processors
On-line error detection and fast recover techniques for dependable embedded processors
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