LOGEX—an automatic logic extractor form transistor to gate level for CMOS technology
DAC '88 Proceedings of the 25th ACM/IEEE Design Automation Conference
Mixed Level Hierarchical Test Generation for Transition Faults and Overcurrent Related Defects
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Analysis of switch-level faults by symbolic simulation
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
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