Graph-Based Algorithms for Boolean Function Manipulation
IEEE Transactions on Computers
COSMOS: a compiled simulator for MOS circuits
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
Test pattern generation for sequential MOS circuits by symbolic fault simulation
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
Efficient implementation of a BDD package
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Sequential circuit verification using symbolic model checking
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Efficient partitioning and analysis of digital CMOS-circuits
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Test Generation for Current Testing (CMOS ICs)
IEEE Design & Test
An Approach to the Development of a IDDQ Testable Cell Library
Proceedings of the The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
Physical DFT for High Coverage of Realistic Faults
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Digital MOS circuit partitioning with symbolic modeling
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Proceedings of the conference on Design, automation and test in Europe
Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits
Journal of Electronic Testing: Theory and Applications
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