An Approach to the Development of a IDDQ Testable Cell Library

• Authors:

• C. Ferrer;D. Dateo;J. Oliver;A. Rubio;M. Rullan

• Affiliations:

• -;-;-;-;-

• Venue:
• Proceedings of the The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
• Year:
• 1994