ATPG tools for delay faults at the functional level

Graph-Based Algorithms for Boolean Function Manipulation

IEEE Transactions on Computers

Efficient implementation of a BDD package

DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference

On testing delay faults in macro-based combinational circuits

ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design

BiTeS: a BDD based test pattern generator for strong robust path delay faults

EURO-DAC '94 Proceedings of the conference on European design automation

Functional test generation for delay faults in combinational circuits

ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design

Test Generation for Path Delay Faults Using Binary Decision Diagrams

IEEE Transactions on Computers

Fastpath: A Path-Delay Test Generator for Standard Scan Designs

Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years