Non-Robust versus Robust

Functional test generation for delay faults in combinational circuits

ACM Transactions on Design Automation of Electronic Systems (TODAES)

On diagnosis of pattern-dependent delay faults

Proceedings of the 37th Annual Design Automation Conference

On applying incremental satisfiability to delay fault testing

DATE '00 Proceedings of the conference on Design, automation and test in Europe

A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing

Journal of Electronic Testing: Theory and Applications

High Quality Robust Tests for Path Delay Faults

VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium

15.1 A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing

VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium

On n-Detection Test Sets and Variable n-Detection Test Sets for Transition Faults

VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium

On Invalidation Mechanisms for Non-Robust Delay Tests

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Algorithms for Switch Level Delay Fault Simulation

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Efficient Identification of Non-Robustly Untestable Path Delay Faults

ITC '97 Proceedings of the 1997 IEEE International Test Conference

A delay fault model for at-speed fault simulation and test generation

Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design

A new delay test based on delay defect detection within slack intervals (DDSI)

IEEE Transactions on Very Large Scale Integration (VLSI) Systems