IEA/AIE '88 Proceedings of the 1st international conference on Industrial and engineering applications of artificial intelligence and expert systems - Volume 1
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
High level hierarchical fault simulation techniques
CSC '85 Proceedings of the 1985 ACM thirteenth annual conference on Computer Science
Testability of 2-Level AND/EXOR Circuits
Journal of Electronic Testing: Theory and Applications
Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits
Journal of Electronic Testing: Theory and Applications
Progress in Design for Test: A Personal View
IEEE Design & Test
On applying non-classical defect models to automated diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Deterministic test generation for non-classical faults on the gate level
ATS '95 Proceedings of the 4th Asian Test Symposium
A Fast Optimal Robust Path Delay Fault Testable Adder
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Testability of 2-level AND/EXOR circuits
EDTC '97 Proceedings of the 1997 European conference on Design and Test
Automatic test-generation and test-verification of digital systems
DAC '74 Proceedings of the 11th Design Automation Workshop
(Quasi-) Linear Path Delay Fault Tests for Adders
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
The Stuck-At Fault: It Ain't Over 'Til It's Over
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors
Journal of Electronic Testing: Theory and Applications
Random Pattern Fault Simulation in Multi-Valued Circuits
ISMVL '95 Proceedings of the 25th International Symposium on Multiple-Valued Logic
Sensitive test data for logic expressions
ACM SIGSOFT Software Engineering Notes
Efficient techniques for transition testing
ACM Transactions on Design Automation of Electronic Systems (TODAES)
A Novel Transition Fault ATPG That Reduces Yield Loss
IEEE Design & Test
Design for Testability A Survey
IEEE Transactions on Computers
A structural theory of machine diagnosis
AFIPS '67 (Spring) Proceedings of the April 18-20, 1967, spring joint computer conference
Design principles for processor maintainability in real-time systems
AFIPS '69 (Fall) Proceedings of the November 18-20, 1969, fall joint computer conference
Design of serviceability features for the IBM system/360
IBM Journal of Research and Development
On-line error detection and fast recover techniques for dependable embedded processors
On-line error detection and fast recover techniques for dependable embedded processors
Post-silicon validation opportunities, challenges and recent advances
Proceedings of the 47th Design Automation Conference
FTCS'95 Proceedings of the Twenty-Fifth international conference on Fault-tolerant computing
LSI logic testing: an overview
IEEE Transactions on Computers
Time complexity of decision trees
Transactions on Rough Sets III
Communication: Diagnosis of constant faults in iteration-free circuits over monotone basis
Discrete Applied Mathematics
Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead
Journal of Electronic Testing: Theory and Applications
A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment
Journal of Electronic Testing: Theory and Applications
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