A structural theory of machine diagnosis

  • Authors:
  • C. V. Ramamoorthy

  • Affiliations:
  • Honeywell, Inc., Waltham, Massachusetts

  • Venue:
  • AFIPS '67 (Spring) Proceedings of the April 18-20, 1967, spring joint computer conference
  • Year:
  • 1967

Quantified Score

Hi-index 0.02

Visualization

Abstract

The present trend in large scale integration of microelectronic technology has focussed a heavy emphasis on the maintenance and diagnostic aspects of large computers. Efficient techniques of diagnosis are important in multi-processors with reconfiguring capabilities to provide high availability. Also, a need exists for simple but effective means of understanding, visualizing and analyzing the problems associated with diagnostics. This paper presents a unified approach based on graph theory, which seems to provide a new insight into the problem without regard to the level of detail under consideration.