An Analysis Model for Digital System Diagnosis
IEEE Transactions on Computers
AFIPS '65 (Fall, part I) Proceedings of the November 30--December 1, 1965, fall joint computer conference, part I
A structural theory of machine diagnosis
AFIPS '67 (Spring) Proceedings of the April 18-20, 1967, spring joint computer conference
Improved Procedures for Determining Diagnostic Resolution
IEEE Transactions on Computers
An integrated approach to automated computer maintenance
FOCS '65 Proceedings of the 6th Annual Symposium on Switching Circuit Theory and Logical Design (SWCT 1965)
A Generalized Theory for System Level Diagnosis
IEEE Transactions on Computers
IEEE Transactions on Computers
Connection Assignments for Probabilistically Diagnosable Systems
IEEE Transactions on Computers
On Minimal Test Sets for Locating Single Link Failures in Networks
IEEE Transactions on Computers
On System Diagnosability in the Presence of Hybrid Faults
IEEE Transactions on Computers
Fault Location in a Semiconductor Random-Access Memory Unit
IEEE Transactions on Computers
Some Existence Theorems for Probabilistically Diagnosable Systems
IEEE Transactions on Computers
Diagnosable Systems for Intermittent Faults
IEEE Transactions on Computers
Diagnosis Without Repair for Hybrid Fault Situations
IEEE Transactions on Computers
Design of Self-Diagnosable Multiprocessor Systems with Concurrent Computation and Diagnosis
IEEE Transactions on Computers
Diagnosis of Systems with Asymmetric Invalidation
IEEE Transactions on Computers
Greedy Diagnosis of Hybrid Fault Situations
IEEE Transactions on Computers
A Fault-Tolerant Communication Architecture for Distributed Systems
IEEE Transactions on Computers
Diagnosis in the Presence of Known Faults
IEEE Transactions on Computers
IEEE Transactions on Computers
On diagnosability of large multiprocessor networks
Discrete Applied Mathematics
Tradeoffs in system level diagnosis of multiprocessor systems
AFIPS '84 Proceedings of the July 9-12, 1984, national computer conference and exposition
A fault diagnosis algorithm for asymmetric modular architectures
IEEE Transactions on Computers
| Hi-index | 15.03 |
Determination of the detectability and diagnosability of a digital system containing at most t faulty system components is considered. The model employed is to an extent independent of the means used to implement diagnostic procedures, i.e., whether the tests are accomplished via hardware, software, or combinations thereof. A parameter, called the closure index, is defined which characterizes the capability for executing valid tests in the presence of faults. The closure index can be thought of as the size of the smallest potentially undetectable multiple-fault in the system as modeled. On the basis of this parameter, results are presented which permit the determination of t-fault detectability and t-fault diagnosability with repair for the system. Examples are presented to illustrate the application of the model for systems close to those encountered in actual practice.