A Procedure for Selecting Diagnostic Tests
IEEE Transactions on Computers
Diagnosis of Single-Gate Failures in Combinational circuits
IEEE Transactions on Computers
Fault Testing and Diagnosis in Combinational Digital Circuits
IEEE Transactions on Computers
AFIPS '65 (Fall, part I) Proceedings of the November 30--December 1, 1965, fall joint computer conference, part I
On the Diagnosis of System Faults with Propagation
IEEE Transactions on Computers
On System Diagnosability in the Presence of Hybrid Faults
IEEE Transactions on Computers
Diagnosis Without Repair for Hybrid Fault Situations
IEEE Transactions on Computers
A Module-Level Testing Approach for Combinational Networks
IEEE Transactions on Computers
Diagnosis of Systems with Asymmetric Invalidation
IEEE Transactions on Computers
Greedy Diagnosis of Hybrid Fault Situations
IEEE Transactions on Computers
Diagnosis in the Presence of Known Faults
IEEE Transactions on Computers
System Fault Diagnosis: Closure and Diagnosability with Repair
IEEE Transactions on Computers
System Fault Diagnosis: Masking, Exposure, and Diagnosability Without Repair
IEEE Transactions on Computers
Tradeoffs in system level diagnosis of multiprocessor systems
AFIPS '84 Proceedings of the July 9-12, 1984, national computer conference and exposition
On Models for Diagnosable Systems and Probabilistic Fault Diagnosis
IEEE Transactions on Computers
A fault diagnosis algorithm for asymmetric modular architectures
IEEE Transactions on Computers
Quantifying fault recovery in multiprocessor systems
Mathematical and Computer Modelling: An International Journal
| Hi-index | 15.01 |
A model for the representation of diagnostic test-fault relationships is presented which provides increased flexibility over previous models and is adaptable to handling large-scale integrated systems. Several forms of the model are given and methods for transforming from one form to another are presented. Procedures are given for assessing the diagnostic capability of the test set and theorems are presented which give necessary and sufficient conditions in terms of the model for diagnosability with and without fault repair. Finally, the model is compared to a number of existing models to demonstrate its flexibility.