A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
A Two-Level Diagnostic Model for Digital Systems
IEEE Transactions on Computers
Analysis of Digital Systems Using a New Measure of System Diagnosis
IEEE Transactions on Computers
Diagnosable Systems for Intermittent Faults
IEEE Transactions on Computers
A Theory of Diagnosability of Digital Systems
IEEE Transactions on Computers
An Analysis Model for Digital System Diagnosis
IEEE Transactions on Computers
System Fault Diagnosis: Closure and Diagnosability with Repair
IEEE Transactions on Computers
System Fault Diagnosis: Masking, Exposure, and Diagnosability Without Repair
IEEE Transactions on Computers
On Models for Diagnosable Systems and Probabilistic Fault Diagnosis
IEEE Transactions on Computers
An Algorithm for Determining the Fault Diagnosability of a System
IEEE Transactions on Computers
On the Diagnosability of a General Model of System with Three-Valued Test Outcomes
IEEE Transactions on Computers
IEEE Transactions on Computers
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This paper is concerned with system diagnosis through analysis of a set of diagnostic test results. It is assumed that a faulty unit may cause one or more tests on a good unit to fail, but may not cause tests on faulty units to pass (asymmetric invalidation). The system model employed is quite general; each test may be invalidated by any one of a set of units, and each test may completely test more than one unit. Conditions for diagnosability with and without repair are determined. Exact methods, as well as simpler approximate methods, are proposed for determining diagnosability and for performing diagnosis. The theory is extended to include diagnosis "by part" (where a part is a set of units). Several illustrative examples are included.