Characterization of Connection Assignment of Diagnosable Systems
IEEE Transactions on Computers
An Analysis Model for Digital System Diagnosis
IEEE Transactions on Computers
On the Diagnosis of System Faults with Propagation
IEEE Transactions on Computers
On the Diagnosability of a General Model of System with Three-Valued Test Outcomes
IEEE Transactions on Computers
A Generalized Theory for System Level Diagnosis
IEEE Transactions on Computers
IEEE Transactions on Computers
Connection Assignments for Probabilistically Diagnosable Systems
IEEE Transactions on Computers
Some Existence Theorems for Probabilistically Diagnosable Systems
IEEE Transactions on Computers
Diagnosable Systems for Intermittent Faults
IEEE Transactions on Computers
An 0(n2.5) Fault Identification Algorithm for Diagnosable Systems
IEEE Transactions on Computers
Diagnosis Without Repair for Hybrid Fault Situations
IEEE Transactions on Computers
Design of Self-Diagnosable Multiprocessor Systems with Concurrent Computation and Diagnosis
IEEE Transactions on Computers
Diagnosis of Systems with Asymmetric Invalidation
IEEE Transactions on Computers
Greedy Diagnosis of Hybrid Fault Situations
IEEE Transactions on Computers
Speed-Efficiency-Complexity Tradeoffs in Universal Diagnosis Algorithms
IEEE Transactions on Computers
Diagnosis in the Presence of Known Faults
IEEE Transactions on Computers
Tradeoffs in system level diagnosis of multiprocessor systems
AFIPS '84 Proceedings of the July 9-12, 1984, national computer conference and exposition
A fault diagnosis algorithm for asymmetric modular architectures
IEEE Transactions on Computers
| Hi-index | 15.03 |
Diagnosability without fault repair of a digital system containing at most t faults is considered. A system-level diagnostic model defined in an earlier paper [1] is employed. The model is to an extent independent of the means used to implement diagnostic procedures, i.e., whether the tests are accomplished via hardware, software, or combinations thereof. Two parameters, the masking and exposure indices, are defined. Conjoined with the previously defined closure index, the parameters fundamentally characterize the capability for executing valid tests in a multiple-fault environment. Necessary and sufficient conditions for a system to be t-fault diagnosable without repair are derived in terms of these parameters. Examples are presented to illustrate the application of the model for systems close to those encountered in actual practice.