On Models for Diagnosable Systems and Probabilistic Fault Diagnosis

Authors:
Shachindra N. Maheshwari;S. Louis Hakimi
Affiliations:
Department of Computer Sciences, Northwestern University, Evanston, IL 60201./ Department of Computer Science, University of Colorado, Boulder, CO 80302.;Departments of Computer Sciences and Electrical Engineering, Northwestern University, Evanston, IL 60201.
Venue:
IEEE Transactions on Computers
Year:
1976

Citing 5
Cited 18

Graph-theoretic models for diagnosis of digital systems.

Graph-theoretic models for diagnosis of digital systems.
Characterization of Connection Assignment of Diagnosable Systems

IEEE Transactions on Computers
Computer Diagnosis Using the Blocking Gate Approach

IEEE Transactions on Computers
An Analysis Model for Digital System Diagnosis

IEEE Transactions on Computers
A self-diagnosable computer

AFIPS '65 (Fall, part I) Proceedings of the November 30--December 1, 1965, fall joint computer conference, part I

An Efficient Algorithm for Identifying the Most Likely Fault Set in a Probabilistically Diagnosable System

IEEE Transactions on Computers - The MIT Press scientific computation series
On the Diagnosis of System Faults with Propagation

IEEE Transactions on Computers
On the Diagnosability of a General Model of System with Three-Valued Test Outcomes

IEEE Transactions on Computers
A Generalized Theory for System Level Diagnosis

IEEE Transactions on Computers
On Adaptive System Diagnosis

IEEE Transactions on Computers
Connection Assignments for Probabilistically Diagnosable Systems

IEEE Transactions on Computers
On System Diagnosability in the Presence of Hybrid Faults

IEEE Transactions on Computers
Some Existence Theorems for Probabilistically Diagnosable Systems

IEEE Transactions on Computers
Diagnosable Systems for Intermittent Faults

IEEE Transactions on Computers
Diagnosis Without Repair for Hybrid Fault Situations

IEEE Transactions on Computers
Diagnosis of Systems with Asymmetric Invalidation

IEEE Transactions on Computers
Greedy Diagnosis of Hybrid Fault Situations

IEEE Transactions on Computers
Speed-Efficiency-Complexity Tradeoffs in Universal Diagnosis Algorithms

IEEE Transactions on Computers
System Diagnosis with Repair

IEEE Transactions on Computers
On the Computational Complexity of System Diagnosis

IEEE Transactions on Computers
An Efficient Fault Diagnosis Algorithm for Symmetric Multiple Processor Architectures

IEEE Transactions on Computers
An Efficient Approach for Fault Diagnosis in a Boolean n-Cube Array of Microprocessors

IEEE Transactions on Computers
A fault diagnosis algorithm for asymmetric modular architectures

IEEE Transactions on Computers

Quantified Score

Hi-index	15.03

Visualization

Abstract

This paper is concerned with automatic fault diagnosis for digital systems with multiple faults. Three problems are treated: 1) Probabilistic fault diagnosis is presented using the graph-theoretic model of Preparata et al. The necessary and sufficient conditions to correctly diagnose any fault set whose probability of occurrence is greater than t have been developed. Some simple sufficient conditions are also discussed. 2) A general model that contains as special cases both the graph-theoretic and the Russell-Kime models is developed. Conditions for T-fault diagnosability are given, thus settling some open problems introduced by Russell and Kime. 3) Finally, sequential T-fault diagnosability is considered. Existence of a class of systems requiring as little as n + T - 1 tests is shown. This improves significantly upon the previously best known class of systems that required n + 2T - 2 tests for sequential T-fault diagnosability.