A distinguishability criterion for selecting efficient diagnostic tests
AFIPS '68 (Spring) Proceedings of the April 30--May 2, 1968, spring joint computer conference
Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic
IEEE Transactions on Computers
Sequential Fault Diagnosis in Combinational Networks
IEEE Transactions on Computers
A Module-Level Testing Approach for Combinational Networks
IEEE Transactions on Computers
R70-24 A Procedure for Selecting Diagnostic Tests
IEEE Transactions on Computers
An Analysis Model for Digital System Diagnosis
IEEE Transactions on Computers
Fault Diagnosis in Combinational Tree Networks
IEEE Transactions on Computers
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The problem considered is the selection of a subset of diagnostic test inputs for combinational circuits. The selected subset of tests will diagnose a single fault to the package level, i.e., until the package which contains the fault is determined. The procedure in obtaining this subset makes use of information provided by multiple outputs, and through a local optimization technique provides a near-optimal global procedure. The local optimization technique weights the tests according to the degree to which they partition the possible faulty packages. The test that provides the greatest partitioning in conjunction with previous selected tests is added to the subset of diagnostic tests.