A New Approach to the Fault Location of Combinational Circuits
IEEE Transactions on Computers
A Procedure for Selecting Diagnostic Tests
IEEE Transactions on Computers
Fault Testing and Diagnosis in Combinational Digital Circuits
IEEE Transactions on Computers
Test Point Placement to Simplify Fault Detection
IEEE Transactions on Computers
Fault Detection in Fanout-Free Combinational Networks
IEEE Transactions on Computers
Fault Equivalence in Combinational Logic Networks
IEEE Transactions on Computers
A distinguishability criterion for selecting efficient diagnostic tests
AFIPS '68 (Spring) Proceedings of the April 30--May 2, 1968, spring joint computer conference
Application of Information Theory to Sequential Fault Diagnosis
IEEE Transactions on Computers
| Hi-index | 14.98 |
In this paper, which is a follow up to [8], we are concerned with the problem of generating minimal experiments to locate and diagnose faults in combinational tree networks. We establish lower bounds on the necessary number of fault-locating tests and show how, in a systematic way, such experiments can be obtained. Two types of testing procedures are considered adaptive and preset.