A method of diagnostic test generation

Authors:
A. B. Carroll;M. Kato;Y. Koga;K. Naemura
Affiliations:
University of Illinois, Urbana, Illinois;University of Illinois, Urbana, Illinois;University of Illinois, Urbana, Illinois;University of Illinois, Urbana, Illinois
Venue:
AFIPS '69 (Spring) Proceedings of the May 14-16, 1969, spring joint computer conference
Year:
1969

Citing 4
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Abstract

A variety of diagnostic techniques have been proposed and applied to error detection and location in computers. The efficiency of the tests generated by them varies from machine to machine depending on the scale of the system, its logic organiztion, and the employed hardware technology. The impact of highly integrated circuitry is changing the trend in logical design of computers.