Testing and testable design of high-density random-access memories
Testing and testable design of high-density random-access memories
Test Routines Based on Symbolic Logical Statements
Journal of the ACM (JACM)
Proceedings of the 38th annual Design Automation Conference
Silicon physical random functions
Proceedings of the 9th ACM conference on Computer and communications security
Intellectual Property Metering
IHW '01 Proceedings of the 4th International Workshop on Information Hiding
Fault Coverage of DC Parametric Tests for Embedded Analog Amplifiers
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
AEGIS: architecture for tamper-evident and tamper-resistant processing
ICS '03 Proceedings of the 17th annual international conference on Supercomputing
Physically Unclonable Function-Based Security and Privacy in RFID Systems
PERCOM '07 Proceedings of the Fifth IEEE International Conference on Pervasive Computing and Communications
Physical unclonable functions for device authentication and secret key generation
Proceedings of the 44th annual Design Automation Conference
A March Test for Functional Faults in Semiconductor Random Access Memories
IEEE Transactions on Computers
Remote activation of ICs for piracy prevention and digital right management
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Active hardware metering for intellectual property protection and security
SS'07 Proceedings of 16th USENIX Security Symposium on USENIX Security Symposium
EPIC: ending piracy of integrated circuits
Proceedings of the conference on Design, automation and test in Europe
Hardware protection and authentication through netlist level obfuscation
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
Extended abstract: The butterfly PUF protecting IP on every FPGA
HST '08 Proceedings of the 2008 IEEE International Workshop on Hardware-Oriented Security and Trust
IC activation and user authentication for security-sensitive systems
HST '08 Proceedings of the 2008 IEEE International Workshop on Hardware-Oriented Security and Trust
Reconfigurable Physical Unclonable Functions - Enabling technology for tamper-resistant storage
HST '09 Proceedings of the 2009 IEEE International Workshop on Hardware-Oriented Security and Trust
Techniques for the diagnosis of switching circuit failures
FOCS '61 Proceedings of the 2nd Annual Symposium on Switching Circuit Theory and Logical Design (SWCT 1961)
HARPOON: an obfuscation-based SoC design methodology for hardware protection
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A Survey of Hardware Trojan Taxonomy and Detection
IEEE Design & Test
Preventing IC Piracy Using Reconfigurable Logic Barriers
IEEE Design & Test
Novel physical unclonable function with process and environmental variations
Proceedings of the Conference on Design, Automation and Test in Europe
RECONFIG '10 Proceedings of the 2010 International Conference on Reconfigurable Computing and FPGAs
Identification of recovered ICs using fingerprints from a light-weight on-chip sensor
Proceedings of the 49th Annual Design Automation Conference
IEEE Spectrum
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits
A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment
Journal of Electronic Testing: Theory and Applications
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The counterfeiting of electronic components has become a major challenge in the 21st century. The electronic component supply chain has been greatly affected by widespread counterfeit incidents. A specialized service of testing, detection, and avoidance must be created to tackle the worldwide outbreak of counterfeit integrated circuits (ICs). So far, there are standards and programs in place for outlining the testing, documenting, and reporting procedures. However, there is not yet enough research addressing the detection and avoidance of such counterfeit parts. In this paper we will present, in detail, all types of counterfeits, the defects present in them, and their detection methods. We will then describe the challenges to implementing these test methods and to their effectiveness. We will present several anti-counterfeit measures to prevent this widespread counterfeiting, and we also consider the effectiveness and limitations of these anti-counterfeiting techniques.