A method for generating weighted random test pattern
IBM Journal of Research and Development
The random testability of the n-input AND gate
STACS 91 Proceedings of the 8th annual symposium on Theoretical aspects of computer science
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
Fast OFDD based minimization of fixed polarity Reed-Muller expressions
EURO-DAC '94 Proceedings of the conference on European design automation
Test Routines Based on Symbolic Logical Statements
Journal of the ACM (JACM)
Logic Synthesis and Optimization
Logic Synthesis and Optimization
Concrete Math
Logic Minimization Algorithms for VLSI Synthesis
Logic Minimization Algorithms for VLSI Synthesis
Minimization of AND-EXOR Expressions Using Rewrite Rules
IEEE Transactions on Computers
ICCD '95 Proceedings of the 1995 International Conference on Computer Design: VLSI in Computers and Processors
Automated Logic Synthesis of Random-Pattern-Testable Circuits
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
A Minimal Universal Test Set for Self-Test of EXOR-Sum-of-Products Circuits
IEEE Transactions on Computers
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It is often stated that AND/EXOR circuits are much easier to test than AND/OR circuits. This statement only holds for restricted classes of AND/EXOR expressions, like positive polarity Reed-Muller expressions and fixed polarity Reed-Muller expressions. For these two classes of circuits good deterministic testability properties are known. In this paper we show that for these circuits also good random pattern testability can be proven. An input probability distribution is given which yields a short expected test length for biased random patterns. This is the first time that theoretical results on random pattern testability have been presented for 2-level AND/EXOR circuit realizations of arbitrary Boolean functions. For more general classes of 2-level AND/EXOR circuits analogous results are not proven. We present experimental results that show that in general minimized 2-level AND/OR circuits are as well (or badly) testable as minimized 2-level AND/EXOR circuits.