A Practical Evaluation of IDDQ Test Strategies for Deep Submicron Production Test Application: Experiences and Targets from the Field

Authors:
Alessandra Fudoli;Alberto Ascagni;Davide Appello;Hans Manhaeve
Affiliations:
-;-;-;-
Venue:
ETW '03 Proceedings of the 8th IEEE European Test Workshop
Year:
2003

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Abstract

This paper describes work in progress on the development of a test strategy for Deep Submicron Production test application based on an optimal use of Scan, Functional and fast IDDQ tests. In particular the IDDQ part of the DSM production test flow is of interest. As to compare different strategies as well as the influence of measurement tools a large number of measurements were carried out on different devices and using different measurement solutions. The results show that in combination with the proper measurement strategy there is a future for DSM production IDDQ testing. Another important conclusion is that the quality of the IDDQ measurement equipment is an important factor affecting the screening efficiency.