On test conditions for the detection of open defects

Authors:
Bram Kruseman;Manuel Heiligers
Affiliations:
Philips Research Laboratories, Eindhoven, The Netherlands;Philips Research Laboratories, Eindhoven, The Netherlands
Venue:
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Year:
2006

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Abstract

The impact of test conditions on the detectability of open defects is investigated. We performed an inductive fault analysis on representative standard gates. The simulation results show that open-like defects result in a wide range of different voltage-delay dependencies, ranging from a strongly increasing to a strongly decreasing delay as a function of voltage. The behaviour is not only determined by the defect location but also by the test pattern. Knowing the expected behaviour of a certain defect location helps failure localisation. The detectability of a defect is strongly determined by the behaviour of the affected path as well as that of the longest path. Our simulations and measurements show that in general elevated supply voltages give a better detectability of open-like defects.