The Impact of Multiple Failure Modes on Estimating Product Field Reliability

Authors:
John M. Carulli Jr.;Thomas J. Anderson
Affiliations:
Texas Instruments;Texas Instruments
Venue:
IEEE Design & Test
Year:
2006

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Abstract

Editor's note: A difficulty in reliability modeling is how to capture all of the various reliability defect types. This is a particularly difficult challenge because defect data varies based on fab, technology maturity, and product details. This article describes the framework and models for representing a multitude of reliability defects. --Phil Nigh, IBM Microelectronics