On the Adaptation of Viterbi Algorithm for Diagnosis of Multiple Bridging Faults
IEEE Transactions on Computers
Diagnosis Method Using ΔIDDQ Probabilistic Signatures: Theory and Results
Journal of Electronic Testing: Theory and Applications
Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment
ITC '98 Proceedings of the 1998 IEEE International Test Conference
On applying non-classical defect models to automated diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Defect level prediction for I_DDQ testing
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Extending the Pseudo-Stuck-At Fault Model to Provide Complete IDDQ Coverage
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Computer-Aided Fault to Defect Mapping (CAFDM) for Defect Diagnosis
ITC '00 Proceedings of the 2000 IEEE International Test Conference
An Empirical Study on the Effects of Test Type Ordering on
ITC '00 Proceedings of the 2000 IEEE International Test Conference
DECOUPLE: DEFECT CURRENT DETECTION IN DEEP SUBMICRON IDDQ
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Intrinsic Leakage in Low Power Deep Submicron CMOS ICs
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Current Signatures: Application
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Current Signatures: Application
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A Study of Test Quality/Tester Scan Memory Trade-offs Using the SEMATECH Test Methods Data
ITC '99 Proceedings of the 1999 IEEE International Test Conference
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Eliminating the Ouija® Board: Automatic Thresholds and Probabilistic IDDQ Diagnosis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
IDDX-based test methods: A survey
ACM Transactions on Design Automation of Electronic Systems (TODAES)
CδIDDQ: improving current-based testing and diagnosis through modified test pattern generation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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