A novel algorithm to extract two-node bridges
Proceedings of the 37th Annual Design Automation Conference
Defect Classes - An Overdue Paradigm for CMOS IC
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Beyond the Byzantine Generals: Unexpected Behaviour and Bridging Fault Diagnosis
Proceedings of the IEEE International Test Conference on Test and Design Validity
Fault Location with Current Monitoring
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Application and Analysis of IDDQ Diagnostic Software
Proceedings of the IEEE International Test Conference
On applying non-classical defect models to automated diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Probabilistic mixed-model fault diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Diagnosis method based on /spl Delta/Iddq probabilistic signatures: experimental results
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A Comparison of Bridging Fault Simulation Methods
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Resistive Bridge Fault Modeling, Simulation and Test Generation
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Expediting Ramp-to-Volume Production
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Eliminating the Ouija® Board: Automatic Thresholds and Probabilistic IDDQ Diagnosis
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Correlation of Logical Failures to a Suspect Process Step
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Diagnosing realistic bridging faults with single stuck-at information
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Locating bridging faults using dynamically computed stuck-at fault dictionaries
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Defect-Oriented Testing and Defective-Part-Level Prediction
IEEE Design & Test
FedEx - A Fast Bridging Fault Extractor
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Rescue: A Microarchitecture for Testability and Defect Tolerance
Proceedings of the 32nd annual international symposium on Computer Architecture
Layout-based defect-driven diagnosis for intracell bridging defects
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Defectdiagnosisinrandomlogiciscurrentlydoneusingthestuck-atfaultmodel, whilemostdefectsseeninmanufacturing result in bridging faults. In this work we usephysical design and test failure information combined withbridgingandstuck-atfaultmodelstolocalizedefectsinrandom logic. We term this approach computer-aided faulttodefectmapping(CAFDM).Webuildontopoftheexistingmaturestuck-atdiagnosisinfrastructure.TheperformanceoftheCAFDMsoftwarewastestedbyinjecting bridging faults into samples of astreaming audiocontrollerchipandcomparingthepredicteddefectlocationsandlayerswiththeactualvalues.Thecorrectdefect location and layer was predicted in all 9 samples forwhichscan-baseddiagnosiscouldbeperformed.Theexperiment was repeated on production samples that failedscan test, with promising results.