A novel algorithm to extract two-node bridges

Authors:
Sujit T. Zachariah;Sreejit Chakravarty;Carl D. Roth
Affiliations:
Microprocessor Products Group, Intel Corporation, Santa Clara, CA;Microprocessor Products Group, Intel Corporation, Santa Clara, CA;Microprocessor Products Group, Intel Corporation, Santa Clara, CA
Venue:
Proceedings of the 37th Annual Design Automation Conference
Year:
2000

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Abstract

Defect based testing is based on the premise that it is possible to extract high probability defects viz. bridges and opens using layout and defect data. We present a very efficient algorithm to extract two-node bridges from layout. Comparison results with a popular tool show that our algorithm is considerably faster and that it has higher capacity.