Integrated Approach for Circuit and Fault Extraction of VLSI Circuits

A novel algorithm to extract two-node bridges

Proceedings of the 37th Annual Design Automation Conference

Defect-Oriented Sampling of Non-Equally Probable Faults in VLSI Systems

Journal of Electronic Testing: Theory and Applications

Defect-oriented test quality assessment using fault sampling and simulation

ITC '98 Proceedings of the 1998 IEEE International Test Conference

13.2 Sampling Techniques of Non-Equally Probable Faults in VLSI Systems

VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium

A Scalable and Efficient Methodology to Extract Two Node Bridges from Large Industrial Circuits

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Algorithm to extract two-node bridges

IEEE Transactions on Very Large Scale Integration (VLSI) Systems