A test methodology to support an ASEM MCM foundry

Authors:
T. Storey;C. Lapihuska;E. Atwood;L. Su
Affiliations:
Loral Federal Systems, Manassas, Virginia;Loral Federal Systems, Manassas, Virginia;IBM Microelectronics Division, E. Fishkill, New York;IBM Microelectronics Division, E. Fishkill, New York
Venue:
ITC'94 Proceedings of the 1994 international conference on Test
Year:
1994

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Abstract

MCM testing can be challenging enough when the chip, substrate, and MCM design are within the control of the same company. In the foundry environment, however, even more robust strategies must be adopted. In this paper a test methodology will be described which consolidates the various MCM test stages to form a flexible, low-cost, quick turn-around-time test flow.