Measurement and Application of Fault Latency
IEEE Transactions on Computers - The MIT Press scientific computation series
Comparing causes of system failure
Microprocessing and Microprogramming
Measurement-Based Analysis of Error Latency
IEEE Transactions on Computers
Observations on the Effects of Fault Manifestation as a Function of Workload
IEEE Transactions on Computers - Special issue on fault-tolerant computing
Field service strategies: the use of cost models
Economics of design and test for electronic circuits and systems
A predictive cost model for automatic test pattern generation
Economics of design and test for electronic circuits and systems
System Complexity and Integrated Diagnostics
IEEE Design & Test
Economic Effects in Design and Test
IEEE Design & Test
Test Sets and Reject Rates: All Fault Coverages are Not Created Equal
IEEE Design & Test
"Resistive Shorts" Within CMOS Gates
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Functional testing of digital systems
DAC '83 Proceedings of the 20th Design Automation Conference
Test generation costs analysis and projections
DAC '80 Proceedings of the 17th Design Automation Conference
Intermittent Faults: A Model and a Detection Procedure
IEEE Transactions on Computers
Software Reliability Status and Perspectives
IEEE Transactions on Software Engineering
Software Reliability Models: Assumptions, Limitations, and Applicability
IEEE Transactions on Software Engineering
From DFT to systems test - a model based cost optimization tool
Proceedings of the conference on Design, automation and test in Europe
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Unlike IC and board level test, system complexity generally limits the number of methods available to support cost-optimised system test strategy development. This paper describes a parameterised model of system behaviour during both production testing and initial field run-time. The model represents the occurrence rate of error and failure events under test and application workloads and the resulting parameters directly characterise system test effectiveness. These event rate models are fitted to actual data and incorporated into a cost function which calculates overall "cost of test" in relation to key variables. The approach is applicable to both hardware and software related events and promotes a customer view of system quality.