ACM Computing Surveys (CSUR)
Maintaining knowledge about temporal intervals
Communications of the ACM
A Mathematical Model for Integrated Diagnostics
IEEE Design & Test
System Testability Assessment for Integrated Diagnostics
IEEE Design & Test
Applying Testability Analysis for Integrated Diagnostics
IEEE Design & Test
Fault Isolation in an Integrated Diagnostic Environment
IEEE Design & Test
Performing Effective Fault Isolation in Integrated Diagnostics
IEEE Design & Test
A Formal Analysis of Fault Diagnosis with D-matrices
Journal of Electronic Testing: Theory and Applications
System test cost modelling based on event rate analysis
ITC'94 Proceedings of the 1994 international conference on Test
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An overview of a complete approach to integrated diagnostics is given. The approach is centered around an information-flow model and incorporates techniques from information fusion and artificial intelligence to guide analyses. The concept of integrated diagnosis is explained, and the model is examined. The authors show how to analyze testability, evaluate fault diagnosis, and create maintenance aids.