Fault Isolation in an Integrated Diagnostic Environment

Authors:
William R. Simpson;John W. Sheppard
Affiliations:
-;-
Venue:
IEEE Design & Test
Year:
1993

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Abstract

The use of information flow models to conduct efficient fault isolation strategies is described. Of particular concern is optimizing diagnosis to minimize some objective cost function. A technique that can include multiple cost criteria such as test time, skill level, and failure frequency, as well as information value, is discussed.