Probabilistic reasoning in intelligent systems: networks of plausible inference
Probabilistic reasoning in intelligent systems: networks of plausible inference
Abductive inference models for diagnostic problem-solving
Abductive inference models for diagnostic problem-solving
Object lifecycles: modeling the world in states
Object lifecycles: modeling the world in states
Information modeling: the EXPRESS way
Information modeling: the EXPRESS way
Object-oriented analysis and design with applications (2nd ed.)
Object-oriented analysis and design with applications (2nd ed.)
System Test and Diagnosis
The Test Access Port and Boundary-Scan Architecture
The Test Access Port and Boundary-Scan Architecture
Fault Isolation in an Integrated Diagnostic Environment
IEEE Design & Test
Improving the accuracy of diagnostics provided by fault dictionaries
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
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We describe a recently approved IEEE standard forexchanging diagnostic information and embeddingdiagnostic reasoners in any test environment. We describethe defined formats and services, an example application,and current industry acceptance.