Improving the accuracy of diagnostics provided by fault dictionaries

Authors:
J. W. Sheppard;W. R. Simpson
Affiliations:
-;-
Venue:
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Year:
1996

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Abstract

Using nearest neighbor classification with fault dictionaries to resolve inexact signature matches in digital circuit diagnosis is inadequate. Nearest neighbor focuses on the possible diagnoses rather than on the tests. Our alternative-the information flow model-focuses on test information in the fault dictionary to provide more accurate diagnostics.