System Complexity and Integrated Diagnostics
IEEE Design & Test
A Mathematical Model for Integrated Diagnostics
IEEE Design & Test
System Testability Assessment for Integrated Diagnostics
IEEE Design & Test
Applying Testability Analysis for Integrated Diagnostics
IEEE Design & Test
Fault Isolation in an Integrated Diagnostic Environment
IEEE Design & Test
Machine Learning
An Intelligent Approach to Automatic Test Equipment
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Hi-index | 0.00 |
Fault trees developed using an entropy-directed search process without modifications or constraints are discussed. To construct a fault tree using entropy-directed search, the computation load is reduced by determining which tests are not needed for diagnosis. The case study of an antitank missile ncher is presented in the context of a complete maintenance architecture.