Diagnosis of realistic bridging faults with single stuck-at information
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Defect Classes - An Overdue Paradigm for CMOS IC
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Yiel Learning via Functional Test Data
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Expediting Ramp-to-Volume Production
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Correlation of Logical Failures to a Suspect Process Step
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Codes
Proceedings of the conference on Design, automation and test in Europe - Volume 2
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This paper presents a new model for gate-to-channel GOS defects. The transistors used in digital cell library are usually designed with a minimum-size. This new model permits to handle minimal-length transistors allowing the simulation of GOS defects ...