Current Signatures: Application
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Current Signatures: Application
ITC '98 Proceedings of the 1998 IEEE International Test Conference
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up
Journal of Electronic Testing: Theory and Applications
Extraction of defect density and size distributions from wafer sort test results
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Extracting Defect Density and Size Distributions from Product ICs
IEEE Design & Test
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