Extracting Defect Density and Size Distributions from Product ICs

Authors:
Jeffrey E. Nelson;Thomas Zanon;Jason G. Brown;Osei Poku;R. D. (Shawn) Blanton;Wojciech Maly;Brady Benware;Chris Schuermyer
Affiliations:
Carnegie Mellon University;Carnegie Mellon University;Carnegie Mellon University;Carnegie Mellon University;Carnegie Mellon University;Carnegie Mellon University;LSI Logic;LSI Logic
Venue:
IEEE Design & Test
Year:
2006

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Abstract

Defect density and size distributions are difficult to characterize, especially if you havelittle or no access to test vehicles specifically designed for the purpose. The authors propose a newmethodology for extracting that information directly from production test data on actual products.