Bridge fault simulation strategies for CMOS integrated circuits
DAC '93 Proceedings of the 30th international Design Automation Conference
Diagnosis of realistic bridging faults with single stuck-at information
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
E-PROOFS: a CMOS bridging fault simulator
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
Test Pattern Generation for Realistic Bridge Faults in CMOS ICs
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
An Accurate Bridging Fault Test Pattern Generator
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Fast and Accurate CMOS Bridging Fault Simulation
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Testing CMOS Logic Gates for Realistic Shorts
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Testing for bridging faults (shorts) in CMOS circuits
DAC '83 Proceedings of the 20th Design Automation Conference
CARAFE: AN INDUCTIVE FAULT ANALYSIS TOOL FOR CMOS VLSI CIRCUITS
CARAFE: AN INDUCTIVE FAULT ANALYSIS TOOL FOR CMOS VLSI CIRCUITS
Bridging Faults in Pipelined Circuits
Journal of Electronic Testing: Theory and Applications
Using satisfiability in application-dependent testing of FPGA interconnects
Proceedings of the 40th annual Design Automation Conference
Precise Test Generation for Resistive Bridging Faults of CMOS Combinational Circuits
ITC '00 Proceedings of the 2000 IEEE International Test Conference
A Comparison of Bridging Fault Simulation Methods
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Resistive Bridge Fault Modeling, Simulation and Test Generation
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Application-Specific Bridging Fault Testing of FPGAs
Journal of Electronic Testing: Theory and Applications
Modeling Feedback Bridging Faults with Non-Zero Resistance
Journal of Electronic Testing: Theory and Applications
Automatic generation of defect injectable VHDL fault models for ASIC standard cell libraries
Integration, the VLSI Journal
Application-dependent testing of FPGAs
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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We describe a system for simulating and generating accurate tests for bridging faults in CMOS ICs. After introducing the Primitive Bridge Function, a characteristic function describing the behavior of a bridging fault, we present the Test Guarantee Theorem, which allows for accurate test generation for feedback bridging faults via topological analysis of the feedback-influenced region of the faulty circuit. We present a bridging fault simulation strategy superior to previously published strategies, describe the new test pattern generation system in detail, and report on the system's performance, which is comparable to that of a single stuck-at ATPG system. The paper reports fault coverage as well as defect coverage for the MCNC layouts of the ISCAS-85 benchmark circuits.