FOCUS: An Experimental Environment for Fault Sensitivity Analysis
IEEE Transactions on Computers
Test Pattern Generation for Realistic Bridge Faults in CMOS ICs
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
A deductive technique for diagnosis of bridging faults
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Logic Testing of Bridging Faults in CMOS Integrated Circuits
IEEE Transactions on Computers
A fault list reduction approach for efficient bridge fault diagnosis
DATE '99 Proceedings of the conference on Design, automation and test in Europe
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Modeling and simulation of real defects using fuzzy logic
Proceedings of the 37th Annual Design Automation Conference
Diagnostic simulation of stuck-at faults in sequential circuits using compact lists
ACM Transactions on Design Automation of Electronic Systems (TODAES)
On effective IDDQ Testing of low-voltage CMOS circuits using leakage control techniques
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Simulating Realistic Bridging and Crosstalk Faults in an Industrial Setting
Journal of Electronic Testing: Theory and Applications
Automatic Test Pattern Generation for Resistive Bridging Faults
Journal of Electronic Testing: Theory and Applications
Automatic generation of defect injectable VHDL fault models for ASIC standard cell libraries
Integration, the VLSI Journal
Hi-index | 0.00 |