GOLDENGATE: a fast and accurate bridging fault simulator under a hybrid logic/IDDQ testing environment

Authors:
Tzuhao Chen;Ibrahim N. Hajj
Affiliations:
Department of Electrical and Computer Engineering and Coordinated Science Laboratory, University of Illinois, Urbana, IL;Department of Electrical and Computer Engineering and Coordinated Science Laboratory, University of Illinois, Urbana, IL
Venue:
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Year:
1997

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Abstract

In this paper we describe GOLDENGATE-a bridging fault simulator for cell-based digital VLSI circuits with the following features: 1. It targets both combinational and sequential circuits. 2. It simulates general (routing, adjacency, and intra-cell) realistic bridging faults efficiently through a table-based scheme. The pre-computed table contains accurate cell output voltage and I/sub DDQ/ values obtained through electrical-level simulations. 3. It simulates both feedback and nonfeedback bridging faults (BFs) efficiently through a cycling event-driven technique. 4. It allows mixed voltage and I/sub DDQ/ simulation to support a fully hybrid test scheme where mixed logic and I/sub DDQ/ sensings are allowed. The experimental results show that GOLDENGATE is both accurate and fast.