Defect oriented testing for CMOS analog and digital circuits
Defect oriented testing for CMOS analog and digital circuits
Bridging Defects Resistance Measurements in a CMOS Process
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Oscillation and Sequential Behavior Caused by Interconnect Opens in Digital CMOS Circuits
Proceedings of the IEEE International Test Conference
Biased Voting: A Method for Simulating CMOS Bridging Faults in the Presence of Variable Gate Logic
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Switch-level bridging fault simulation in the presence of feedbacks
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Identification of Feedback Bridging Faults with Oscillation
ATS '99 Proceedings of the 8th Asian Test Symposium
Switch-level modeling of feedback faults using global oscillation control
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Precise Test Generation for Resistive Bridging Faults of CMOS Combinational Circuits
ITC '00 Proceedings of the 2000 IEEE International Test Conference
The concept of resistance interval: a new parametric model for realistic resistive bridging fault
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
A Comparison of Bridging Fault Simulation Methods
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Resistive Bridge Fault Modeling, Simulation and Test Generation
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Current testability analysis of feedback bridging faults in CMOS circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In this paper we analyze fault behaviors of internal feedback bridging faults. To investigate their behaviors, we use a simple circuit model consisting of 2-input NAND gate and NOT gate. From analysis results, we find that behaviors of internal feedback bridging faults are more complex than those of external feedback bridging faults. We expose that they cause IDDQ-only failure, internal latch and internal oscillation as well as latch and oscillation behavior. These phenomena are caused by the following facts: formation of an electrically conducting feedback loop and connection of the feedback loop with the circuit output depend on input values of the circuit, and the feedback loop is often alive only within the circuit. We also discuss methods for detecting this kind of fault.