Defect oriented testing for CMOS analog and digital circuits

Integrated Design and Test of Mixed-Signal Circuits

Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop

Behavior Analysis of Internal Feedback Bridging Faults in CMOS Circuits

Journal of Electronic Testing: Theory and Applications

Configurations for IDDQ-Testable PLAs

IEEE Design & Test

Investigations for Minimum Invasion Digital Only Built-In “Ramp” Based Test Techniques for Charge Pump PLL's

Journal of Electronic Testing: Theory and Applications

Built-In Self-Test for GHz Embbedded SRAMS Using Flexible Pattern Generator And New Repair Algorithm

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Towards generic charge-pump phase-locked loop, jitter estimation techniques using indirect on chip methods

Integration, the VLSI Journal

Graphical IDDQ signatures reduce defect level and yield loss

IEEE Transactions on Very Large Scale Integration (VLSI) Systems