Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits
Journal of Electronic Testing: Theory and Applications
Test cost reduction for SOCs using virtual TAMs and lagrange multipliers
Proceedings of the 40th annual Design Automation Conference
A Technique for High Ratio LZW Compression
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
On-Chip Test Infrastructure Design for Optimal Multi-Site Testing of System Chips
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Concurrent Core Test for Test Cost Reduction Using Merged Test Set and Scan Tree
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Concurrent core test for SOC using shared test set and scan chain disable
Proceedings of the conference on Design, automation and test in Europe: Proceedings
A test pattern ordering algorithm for diagnosis with truncated fail data
Proceedings of the 43rd annual Design Automation Conference
Modular and rapid testing of SOCs with unwrapped logic blocks
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Substrate Testing on a Multi-Site/Multi-Probe ATE
Journal of Electronic Testing: Theory and Applications
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Computers and Electrical Engineering
A diagnosis algorithm for extreme space compaction
Proceedings of the Conference on Design, Automation and Test in Europe
SOC test planning using virtual test access architectures
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model
Journal of Electronic Testing: Theory and Applications
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Test approaches that can be combined with multi-site, like reduced pin-count test, low channel cost ATE, and bandwidth matching, are becoming pervasive. Yet their economic benefits, the tradeoffs, and the long-term scalability of their benefits during technology progress, are not well understood. In this paper the benefits and tradeoffs will be analyzed using technical cost modeling. The dependency of the benefits on the application will be analyzed by modeling the test cost for 4 different applications. It will be shown that the mentioned test approaches can result in a significant and scalable reduction of the Cost of Test.