Algorithms for IDDQ measurement based diagnosis of bridging faults
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
A Practical Approach to Fault Simulation and Test Generation for Bridging Faults
IEEE Transactions on Computers
A method of fault simulation based on stem regions
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Test pattern generation using Boolean satisfiability
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A CMOS fault extractor for inductive fault analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
On adaptive diagnostic test generation
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Diagnosis of realistic bridging faults with single stuck-at information
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
A deductive technique for diagnosis of bridging faults
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Location of Stuck-At Faults and Bridging Faults Based on Circuit Partitioning
IEEE Transactions on Computers
Modeling the unknown! Towards model-independent fault and error diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A simple technique for locating gate-level faults in combinational circuits
ATS '95 Proceedings of the 4th Asian Test Symposium
Voting model based diagnosis of bridging faults in combinational circuits
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
Using fault sampling to compute I/sub DDQ/ diagnostic test sets
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
An Improved Fault Diagnosis Algorithm Based on Path Tracing with Dynamic Circuit Extraction
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Bridging Fault Diagnosis in the Absence of Physical Information
ITC '97 Proceedings of the 1997 IEEE International Test Conference
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Fault Diagnosis and Fault Model Aliasing
ISVLSI '05 Proceedings of the IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design
Selection of a fault model for fault diagnosis based on unique responses
Proceedings of the Conference on Design, Automation and Test in Europe
Selection of a fault model for fault diagnosis based on unique responses
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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