Automatic Pattern Generation for Diagnosis of Wiring Interconnect Faults

A Sweeping Line Approach to Interconnect Testing

IEEE Transactions on Computers

Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards

ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design

BIST TPG for Combinational Cluster Interconnect Testing at Board Level

Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98

Using fault sampling to compute I/sub DDQ/ diagnostic test sets

VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium