HOPE: an efficient parallel fault simulator for synchronous sequential circuits
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
Algorithms for IDDQ measurement based diagnosis of bridging faults
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Test Generation for Current Testing (CMOS ICs)
IEEE Design & Test
Approximation algorithms for combinatorial problems
Journal of Computer and System Sciences
Fast Algorithms for Computer IDDQ Tests for Combination Circuits
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
Hi-index | 0.00 |
Selecting a small subset of the set of functional vectors for performing IDDQ measurement has previously been studied for leakage but not for bridging faults. Algorithms for this problem for all two line bridging faults, in combinational and sequential circuits, along with experimental results are presented.