Fast Algorithms for Computer IDDQ Tests for Combination Circuits

  • Authors:
  • P. Thadikaran;S. Chadravarty

  • Affiliations:
  • -;-

  • Venue:
  • VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
  • Year:
  • 1996

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Abstract

A system to generate IDDQ tests for bridging faults (BFs) and leakage faults in combinational CMOS circuit is de-scribed. Experimental results for different sets of BFs demonstrates the efficiency and flexibility of the approach.